发明名称 SUBSTRATE PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing device which is capable of effectively removing surface roughness in the periphery of a substrate or a film which adheres to the periphery or the like of the substrate to become a pollution source in a process of manufacturing a semiconductor device. SOLUTION: The substrate processing device performs a process of pressing a polishing tape 21 on the prescribed spot of the substrate W and polishing the substrate W by sliding the tape 21 on the substrate W. The substrate processing device is equipped with a polishing unit 10 which is provided with an edge polishing unit 20 that polishes the edge E of the substrate W pressing the polishing tape 21 against the edge E, and a beveled part polishing unit 40 that polishes the beveled part B of the substrate W pressing the polishing tape 21 against the beveled part B. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004241434(A) 申请公布日期 2004.08.26
申请号 JP20030026367 申请日期 2003.02.03
申请人 EBARA CORP;TOSHIBA CORP 发明人 NAKANISHI MASAYUKI;ISHII YU;NAKAMURA KENRO
分类号 H01L21/304;B24B9/06;B24B21/00;(IPC1-7):H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址