发明名称 |
SUBSTRATE PROCESSING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing device which is capable of effectively removing surface roughness in the periphery of a substrate or a film which adheres to the periphery or the like of the substrate to become a pollution source in a process of manufacturing a semiconductor device. SOLUTION: The substrate processing device performs a process of pressing a polishing tape 21 on the prescribed spot of the substrate W and polishing the substrate W by sliding the tape 21 on the substrate W. The substrate processing device is equipped with a polishing unit 10 which is provided with an edge polishing unit 20 that polishes the edge E of the substrate W pressing the polishing tape 21 against the edge E, and a beveled part polishing unit 40 that polishes the beveled part B of the substrate W pressing the polishing tape 21 against the beveled part B. COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004241434(A) |
申请公布日期 |
2004.08.26 |
申请号 |
JP20030026367 |
申请日期 |
2003.02.03 |
申请人 |
EBARA CORP;TOSHIBA CORP |
发明人 |
NAKANISHI MASAYUKI;ISHII YU;NAKAMURA KENRO |
分类号 |
H01L21/304;B24B9/06;B24B21/00;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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