发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE FOR REDUCING THICKNESS OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing semiconductor device is provided to thin the semiconductor device without deteriorating productivity while maintaining a characteristic of an integrated circuit formed on a surface of the semiconductor device. CONSTITUTION: A back surface of a semiconductor substrate(10) having an integrated circuit formed on a front surface thereof is mechanically polished. The back surface of the semiconductor substrate is etched by using a chemical reaction. In the mechanical polishing process, the semiconductor substrate is ground so as to have a thickness sufficient to prevent a defect caused on the back surface thereof from reaching a front surface thereof. In the etching process, the semiconductor substrate is ground so as to be thinner by an amount corresponding to a concave/convex difference on the back surface after the mechanical polishing.
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申请公布号 |
KR20040110995(A) |
申请公布日期 |
2004.12.31 |
申请号 |
KR20040041629 |
申请日期 |
2004.06.08 |
申请人 |
SANYO ELECTRIC CO., LTD. |
发明人 |
SASAKI, KAORU;YAMAMOTO, KEIJI |
分类号 |
H01L23/52;H01L21/304;H01L21/306;H01L21/3205;H01L21/70;H01L21/78;H01L23/12;H01L29/74;(IPC1-7):H01L21/304 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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