发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE FOR REDUCING THICKNESS OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing semiconductor device is provided to thin the semiconductor device without deteriorating productivity while maintaining a characteristic of an integrated circuit formed on a surface of the semiconductor device. CONSTITUTION: A back surface of a semiconductor substrate(10) having an integrated circuit formed on a front surface thereof is mechanically polished. The back surface of the semiconductor substrate is etched by using a chemical reaction. In the mechanical polishing process, the semiconductor substrate is ground so as to have a thickness sufficient to prevent a defect caused on the back surface thereof from reaching a front surface thereof. In the etching process, the semiconductor substrate is ground so as to be thinner by an amount corresponding to a concave/convex difference on the back surface after the mechanical polishing.
申请公布号 KR20040110995(A) 申请公布日期 2004.12.31
申请号 KR20040041629 申请日期 2004.06.08
申请人 SANYO ELECTRIC CO., LTD. 发明人 SASAKI, KAORU;YAMAMOTO, KEIJI
分类号 H01L23/52;H01L21/304;H01L21/306;H01L21/3205;H01L21/70;H01L21/78;H01L23/12;H01L29/74;(IPC1-7):H01L21/304 主分类号 H01L23/52
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