发明名称 |
PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE ELEMENT, METHOD FOR FORMING RESIST PATTERN, AND METHOD FOR MANUFACTURING SEMICONDUCTOR COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a photosensitive resin composition having excellent resolution.SOLUTION: The photosensitive resin composition is to be used in a method of manufacturing a semiconductor component including: a step of forming a photosensitive layer on a substrate by using a photosensitive resin composition; a step of irradiating a predetermined portion of the photosensitive layer to expose the predetermined portion and then heating the photosensitive layer after exposure; and a development step of removing a portion of the photosensitive layer other than the predetermined portion so as to form a resist pattern comprising a cured product of the photosensitive resin composition on the substrate. The photosensitive resin composition comprises the following components of: (A) a resin having a phenolic hydroxyl group; (B) an aliphatic or alicyclic epoxy compound having two or more oxirane rings; and (C) a photosensitive acid generator. The photosensitive resin composition has a content of a sensitizer of 1 part by mass or less with respect to 100 parts by mass of (A) component.SELECTED DRAWING: None |
申请公布号 |
JP2016188921(A) |
申请公布日期 |
2016.11.04 |
申请号 |
JP20150068546 |
申请日期 |
2015.03.30 |
申请人 |
HITACHI CHEMICAL CO LTD |
发明人 |
LEE SANG CHUL;KATO TETSUYA;IWASHITA KENICHI;MURAMATSU YUKIKO;SAWABE MASARU |
分类号 |
G03F7/038;G03F7/004;H05K3/06;H05K3/12;H05K3/18 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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