发明名称 METHOD OF MANUFACTURING SIMULTANEOUSLY VIA HOLE AND TRENCH FOR INDUCTOR OF SEMICONDUCTOR DEVICE FOR SIMPLIFYING MANUFACTURING PROCESSES
摘要 PURPOSE: A method is provided to simplify manufacturing processes by forming simultaneously a via hole and a trench on a photoresist layer using one time photo process. CONSTITUTION: A metal seed layer(112) and a photoresist layer(114) are formed on a semiconductor substrate(110). The photoresist layer is exposed to light by using a mask pattern(100) and sequentially developed. At this time, a via hole is formed on the photoresist layer due to a light transmitting substrate(102) of the mask pattern, a trench with a shallower depth than that of the via hole is formed on the photoresist layer due to a phase shift pattern(104) of the mask pattern and the other portion of the photoresist layer is left due to a light shielding pattern(106) of the mask pattern.
申请公布号 KR20050011103(A) 申请公布日期 2005.01.29
申请号 KR20030049945 申请日期 2003.07.21
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM, YOUNG KEUN
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
代理机构 代理人
主权项
地址