发明名称 METHOD OF IMPROVING INVERSE NARROW WIDTH EFFECT(INWE) USING ENHANCED STI STRUCTURE FOR PREVENTING CONVERGENCE OF ELECTRIC FIELD
摘要 PURPOSE: A method of improving INWE(Inverse Narrow Width Effect) is provided to prevent electric field from being converged on a corner of an STI(Shallow Trench Isolation) structure by forming roundly the corner of the STI structure. CONSTITUTION: A first silicon oxide layer and a silicon nitride layer are sequentially formed on a silicon substrate(100). A plurality of trenches are formed in the substrate by using an STI photomask. The photomask is removed therefrom and a silicon ion-implantation is performed thereon. A heat treatment is performed on the resultant structure to form roundly corners of each trench. A second silicon oxide layer(106) is filled in the trench and planarized.
申请公布号 KR20050011096(A) 申请公布日期 2005.01.29
申请号 KR20030049938 申请日期 2003.07.21
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM, JIN KWAN
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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