发明名称 |
METHOD OF IMPROVING INVERSE NARROW WIDTH EFFECT(INWE) USING ENHANCED STI STRUCTURE FOR PREVENTING CONVERGENCE OF ELECTRIC FIELD |
摘要 |
PURPOSE: A method of improving INWE(Inverse Narrow Width Effect) is provided to prevent electric field from being converged on a corner of an STI(Shallow Trench Isolation) structure by forming roundly the corner of the STI structure. CONSTITUTION: A first silicon oxide layer and a silicon nitride layer are sequentially formed on a silicon substrate(100). A plurality of trenches are formed in the substrate by using an STI photomask. The photomask is removed therefrom and a silicon ion-implantation is performed thereon. A heat treatment is performed on the resultant structure to form roundly corners of each trench. A second silicon oxide layer(106) is filled in the trench and planarized.
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申请公布号 |
KR20050011096(A) |
申请公布日期 |
2005.01.29 |
申请号 |
KR20030049938 |
申请日期 |
2003.07.21 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
KIM, JIN KWAN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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主权项 |
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地址 |
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