发明名称 |
FET WITH FIN PATTERN FOR IMPROVING THE MOBILITY OF CHARGES AND FORMING METHOD THEREOF |
摘要 |
PURPOSE: A fin FET(Field Effect Transistor) and a forming method thereof are provided to improve performance of the FET by using a fin pattern with enhanced structure. CONSTITUTION: A fin FET includes a fin pattern, a gate electrode, a gate insulating layer, and a pair of impurity diffused layers. The fin pattern(118) is formed on a support substrate(105). The fin pattern includes a plurality of first semiconductor patterns(110a) and second semiconductor patterns(112a) alternately stacked with each other. The gate electrode(122) crosses over an upper portion of the fin pattern via the gate insulating layer(120). The pair of impurity diffused layers are formed at both sides of the gate electrode in the fin pattern. The first semiconductor pattern is made of a strained silicon pattern and the second semiconductor pattern is made of a SiGe pattern.
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申请公布号 |
KR20050011455(A) |
申请公布日期 |
2005.01.29 |
申请号 |
KR20030050569 |
申请日期 |
2003.07.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, SI YOUNG;KIM, YOUNG PIL;LEE, SUN GHIL |
分类号 |
H01L21/336;H01L29/745;H01L29/76;H01L29/78;H01L29/786;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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