发明名称 Method of etching a mask layer and a protecting layer for metal contact windows
摘要 A method of etching a mask layer as a protecting layer for metal contact windows uses a victim layer with slopes to avoid undercutting. First, a mask layer is formed on a semiconductor substrate. Next, a photoresist with patterns is formed on the surface of the mask layer. Next, a victim layer is formed on the surface of the photoresist according to the photoresist topography, such that a plurality of slopes is formed on the sidewalls of the photoresist. The photoresist and the victim layer with slopes are used as the etching mask to etch the mask layer to form patterns.
申请公布号 US6852637(B2) 申请公布日期 2005.02.08
申请号 US20020053160 申请日期 2002.01.15
申请人 NANYA TECHNOLOGY CORPORATION 发明人 HUANG TSAI-YU;WANG RAYMOND;SU SHENG-CHUAN
分类号 H01L21/033;H01L21/311;(IPC1-7):H01L21/302 主分类号 H01L21/033
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