发明名称 Method for manufacturing magnetoresistive device
摘要 The present invention provides a method for manufacturing a magnetoresistive effect device which can improve the through-put and achieve a high MR ratio. A method for manufacturing a magnetoresistive device according to an embodiment of the present invention includes steps of: forming a first ferromagnetic layer; forming a tunnel barrier layer on the first ferromagnetic layer in a first chamber; and forming a second ferromagnetic layer on the tunnel barrier layer, wherein the step of forming the tunnel barrier layer includes steps of: forming a metal layer on the first ferromagnetic layer; oxidizing the metal layer; and, before the step of forming the second ferromagnetic layer, reducing a pressure inside the first chamber to a predetermined pressure at which the metal layer vaporizes, while keeping a temperature inside the first chamber at a predetermined temperature.
申请公布号 US9502644(B1) 申请公布日期 2016.11.22
申请号 US201615196992 申请日期 2016.06.29
申请人 CANON ANELVA CORPORATION 发明人 Nagamine Yoshinori;Saruya Takeshi
分类号 H01L43/08;H01L43/12;H01L43/10;H01L43/02;G11B5/39;G01R33/09 主分类号 H01L43/08
代理机构 Fitzpatrick, Cella, Harper & Scinto 代理人 Fitzpatrick, Cella, Harper & Scinto
主权项 1. A method for manufacturing a magnetoresistive device, comprising steps of: preparing a substrate on which a first ferromagnetic layer is formed; forming a tunnel barrier layer on the first ferromagnetic layer in a first chamber; and forming a second ferromagnetic layer on the tunnel barrier layer, wherein the step of forming the tunnel barrier layer includes steps of: forming a metal layer on the first ferromagnetic layer;oxidizing the metal layer; andbefore the step of forming the second ferromagnetic layer, reducing a pressure inside the first chamber to a predetermined pressure at which the metal layer vaporizes, while keeping a temperature inside the first chamber at a predetermined temperature.
地址 Kawasaki-Shi JP