发明名称 |
TRANSPORTATION SYSTEM AND TRANSPORTATION METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To realize an electron beam proximity exposure apparatus which is low in cost and is high in a throughput. <P>SOLUTION: The electron beam proximity exposure apparatus includes vacuum chamber 1 which contains a stage 5 that moves keeping a wafer 4 and an electron optical column 2 that irradiates an electron beam to a mask 3 to expose an exposure pattern in a state where the mask 3 having an opening pattern corresponding to the exposure pattern is located close to the wafer 4 held on the stage 5, a load lock mechanism 31 which takes the wafer under an atmospheric pressure into the vacuum chamber 1 and returns the wafer under an atmospheric pressure, and a mask opener 51 which takes the mask 3 stored in a mask container 60 into the vacuum chamber 1 and returns it to the mask container 60. The electron beam approaching exposure apparatus also is equipped with a transfer mechanism 11 which transfers the wafer 4 between the stage 5 and the load lock mechanism 31 and transfers the mask 3 between the stage 5 and the mask opener 51. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2005175413(A) |
申请公布日期 |
2005.06.30 |
申请号 |
JP20040026524 |
申请日期 |
2004.02.03 |
申请人 |
TOKYO SEIMITSU CO LTD |
发明人 |
FUJITA TAICHI;KUWABARA TAKAYOSHI;HIRANO TETSUYA;CHIBA KIYOTAKA;TOMITA TOMIO;MASE FUMIO;KASAHARA TAKEHIRO |
分类号 |
G03F7/20;H01L21/027;H01L21/673;H01L21/677;H01L21/68;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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