发明名称 TRANSPORTATION SYSTEM AND TRANSPORTATION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To realize an electron beam proximity exposure apparatus which is low in cost and is high in a throughput. <P>SOLUTION: The electron beam proximity exposure apparatus includes vacuum chamber 1 which contains a stage 5 that moves keeping a wafer 4 and an electron optical column 2 that irradiates an electron beam to a mask 3 to expose an exposure pattern in a state where the mask 3 having an opening pattern corresponding to the exposure pattern is located close to the wafer 4 held on the stage 5, a load lock mechanism 31 which takes the wafer under an atmospheric pressure into the vacuum chamber 1 and returns the wafer under an atmospheric pressure, and a mask opener 51 which takes the mask 3 stored in a mask container 60 into the vacuum chamber 1 and returns it to the mask container 60. The electron beam approaching exposure apparatus also is equipped with a transfer mechanism 11 which transfers the wafer 4 between the stage 5 and the load lock mechanism 31 and transfers the mask 3 between the stage 5 and the mask opener 51. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005175413(A) 申请公布日期 2005.06.30
申请号 JP20040026524 申请日期 2004.02.03
申请人 TOKYO SEIMITSU CO LTD 发明人 FUJITA TAICHI;KUWABARA TAKAYOSHI;HIRANO TETSUYA;CHIBA KIYOTAKA;TOMITA TOMIO;MASE FUMIO;KASAHARA TAKEHIRO
分类号 G03F7/20;H01L21/027;H01L21/673;H01L21/677;H01L21/68;(IPC1-7):H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址