发明名称 Method and apparatus for surface configuration measurement
摘要 A method and an apparatus for surface configuration measurement of the present invention use stereoscopic lattice type of moiré optics as testing optics. The moiré optics accurately shifts moiré fringes of particular fringe order by a preselected phase without any shift error. A line sensor camera, which is a specific form of a camera, limits a measurement range to the vicinity of the particular fringe order. The camera outputs at least three moiré image data shifted in phase. A phase shifting method can therefore be easily applied to the stereoscopic lattice type of moiré optics without giving any consideration to the accurate phase shift of the entire fringe orders. The apparatus can measure the surface configuration of a work with high accuracy.
申请公布号 US6940608(B2) 申请公布日期 2005.09.06
申请号 US20020092599 申请日期 2002.03.08
申请人 RICOH COMPANY, LTD. 发明人 SAKITA RYUUJI
分类号 G01B11/25;(IPC1-7):G01B11/24 主分类号 G01B11/25
代理机构 代理人
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