发明名称 METHOD OF PEELING POSITIVE RESIST FILM, METHOD OF MANUFACTURING EXPOSURE MASK, AND RESIST PEELING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method of peeling a positive resist film which requires no special management prescribed by the Fire Service Law and various environmental laws, enables processing with low cost, and requires no large-scale processing apparatus for a large substrate. <P>SOLUTION: A substrate has a positive resist film, and the surface of the resist film is exposed and developed to form a resist pattern. After a thin film is etched with the resist pattern serving as a mask, the resist film is entirely irradiated with exposure light and brought into contact with developer, so that the patterned resist film is peeled off. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2005317929(A) 申请公布日期 2005.11.10
申请号 JP20050069133 申请日期 2005.03.11
申请人 HOYA CORP 发明人 IMURA KAZUHISA
分类号 G03F7/30;G03F7/00;G03F7/26;G03F7/42;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/30
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