| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a ROM test circuit in which a test time can be shortened, and a ROM test method. <P>SOLUTION: When data written in a plurality of ROMs 10, 12, 14 are tested, since data of the ROM1 (10) and the ROM2(12) are selected on the basis of output data of a specific ROm3(14) and the test is performed by comparing selected data with an expected value, contents of the ROM3 are also tested in the test time of the ROM1, ROM2, the test time can be shortened. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
