发明名称 Method for forming image-sensor device
摘要 A method for forming an image-sensor device is provided. The method includes providing a first semiconductor substrate having a first surface and a second surface opposite to the first surface. The method includes forming a device layer over the first surface of the first semiconductor substrate. The method includes bonding the first semiconductor substrate to a second semiconductor substrate after the formation of the device layer. The second surface faces the second semiconductor substrate. The method includes forming a diffusion layer between the first semiconductor substrate and the second semiconductor substrate. The diffusion layer has a dopant concentration gradient that increases in a direction from the first semiconductor substrate toward the second semiconductor substrate.
申请公布号 US9620556(B2) 申请公布日期 2017.04.11
申请号 US201514937372 申请日期 2015.11.10
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Tu Chien-Nan;Yeh Yu-Lung;Wu Ming-Hsien
分类号 H01L27/14;H01L27/146 主分类号 H01L27/14
代理机构 Birch, Stewart, Kolasch & Birch, LLP 代理人 Birch, Stewart, Kolasch & Birch, LLP
主权项 1. A method for forming an image-sensor device, comprising: providing a first semiconductor substrate having a first surface and a second surface opposite to the first surface; forming a device layer over the first surface of the first semiconductor substrate; after the formation of the device layer, bonding the first semiconductor substrate to a second semiconductor substrate, wherein the second surface faces the second semiconductor substrate; and forming a diffusion layer between the first semiconductor substrate and the second semiconductor substrate, wherein the diffusion layer has a dopant concentration gradient that increases in a direction from the first semiconductor substrate toward the second semiconductor substrate.
地址 Hsinchu TW