发明名称 FinFET device including a dielectrically isolated silicon alloy fin
摘要 A method includes forming a fin on a semiconductor substrate. An isolation structure is formed adjacent the fin. A silicon alloy material is formed on a portion of the fin extending above the isolation structure. A thermal process is performed to define a silicon alloy fin portion from the silicon alloy material and the fin and to define a first insulating layer separating the fin from the substrate.
申请公布号 US9634123(B2) 申请公布日期 2017.04.25
申请号 US201514676909 申请日期 2015.04.02
申请人 GLOBALFOUNDRIES Inc. 发明人 Jacob Ajey Poovannummoottil
分类号 H01L29/66;H01L21/762;H01L29/78 主分类号 H01L29/66
代理机构 Amerson Law Firm, PLLC 代理人 Amerson Law Firm, PLLC
主权项 1. A method, comprising: forming a fin on a semiconductor substrate; forming an isolation structure adjacent said fin; depositing a first layer to form a silicon alloy material layer above and in direct contact with an outer sidewall surface of said fin extending above said isolation structure after forming said isolation structure; and performing a thermal process to define a silicon alloy fin portion from said silicon alloy material layer and said fin and to define a first insulating layer separating said fin from said substrate.
地址 Grand Cayman KY