发明名称 |
FinFET device including a dielectrically isolated silicon alloy fin |
摘要 |
A method includes forming a fin on a semiconductor substrate. An isolation structure is formed adjacent the fin. A silicon alloy material is formed on a portion of the fin extending above the isolation structure. A thermal process is performed to define a silicon alloy fin portion from the silicon alloy material and the fin and to define a first insulating layer separating the fin from the substrate. |
申请公布号 |
US9634123(B2) |
申请公布日期 |
2017.04.25 |
申请号 |
US201514676909 |
申请日期 |
2015.04.02 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Jacob Ajey Poovannummoottil |
分类号 |
H01L29/66;H01L21/762;H01L29/78 |
主分类号 |
H01L29/66 |
代理机构 |
Amerson Law Firm, PLLC |
代理人 |
Amerson Law Firm, PLLC |
主权项 |
1. A method, comprising:
forming a fin on a semiconductor substrate; forming an isolation structure adjacent said fin; depositing a first layer to form a silicon alloy material layer above and in direct contact with an outer sidewall surface of said fin extending above said isolation structure after forming said isolation structure; and performing a thermal process to define a silicon alloy fin portion from said silicon alloy material layer and said fin and to define a first insulating layer separating said fin from said substrate. |
地址 |
Grand Cayman KY |