发明名称 High quantum efficiency photodetector
摘要 A photodetector including a photoelectric conversion structure made of a semiconductor material and, on a light-receiving surface of the conversion structure, a stack of first and second diffractive elements, the second element being above the first element, wherein: the first element includes at least one pad made of a material having an optical index n1, laterally surrounded with a region made of a material having an optical index n2 different from n1; the second element includes at least one pad made of a material having an optical index n3, laterally surrounded with a region made of a material having an optical index n4 different from n3; the pads of the first and second elements are substantially vertically aligned; and optical index differences n1−n2 and n3−n4 have opposite signs.
申请公布号 US9640704(B2) 申请公布日期 2017.05.02
申请号 US201615163550 申请日期 2016.05.24
申请人 Commissariat à l'Énergie Atomique et aux Énergies Alternatives;STMicroelectronics SA 发明人 Frey Laurent;Marty Michel
分类号 H01L29/49;H01L31/113;H01L31/0232;H01L31/107;H01L27/146 主分类号 H01L29/49
代理机构 Wolf, Greenfield & Sacks, P.C. 代理人 Wolf, Greenfield & Sacks, P.C.
主权项 1. A photodetector comprising a photoelectric conversion structure made of a semiconductor material and, on a light-receiving surface of the conversion structure, a stack of first and second diffractive elements, the second element being above the first element, wherein: the first element comprises at least one pad made of a material having an optical index n1, laterally surrounded with a region made of a material having an optical index n2 different from n1; the second element comprises at least one pad made of a material having an optical index n3, laterally surrounded with a region made of a material having an optical index n4 different from n3; the pads of the first and second elements are substantially vertically aligned; and optical index differences n1−n2 and n3−n4 have opposite signs.
地址 Paris FR