发明名称 |
SOLAR CELL AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A method of manufacturing a solar cell is discussed. The method includes forming a textured structure on a front surface of a silicon substrate; forming a front passivation layer on the front surface of the silicon substrate; forming an anti-reflection layer on the front passivation layer; forming a first layer having a dopant of a first conductive type on a first portion of a rear surface of the silicon substrate; forming a second layer having a dopant of a second conductive type on the first layer and a second portion of the rear surface of the silicon substrate; diffusing the dopant of the first layer and the dopant of the second layer into the silicon substrate to form a n-doped region and a p-doped region, respectively, wherein the n-doped region and the p-doped region are disposed at about a same depth from the rear surface of the silicon substrate. |
申请公布号 |
US2017125617(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201615357532 |
申请日期 |
2016.11.21 |
申请人 |
LG ELECTRONICS INC. |
发明人 |
LEE Sungeun;CHOE Youngho |
分类号 |
H01L31/0224;H01L31/068;H01L31/0216;H01L31/18;H01L31/0236 |
主分类号 |
H01L31/0224 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a solar cell, the method comprising:
forming a textured structure on a front surface of a silicon substrate; forming a front passivation layer on the front surface of the silicon substrate; forming an anti-reflection layer on the front passivation layer; forming a first layer having a dopant of a first conductive type on a first portion of a rear surface of the silicon substrate; forming a second layer having a dopant of a second conductive type on the first layer and a second portion of the rear surface of the silicon substrate; diffusing the dopant of the first layer and the dopant of the second layer into the silicon substrate to form a n-doped region and a p-doped region, respectively, wherein the n-doped region and the p-doped region are disposed at about a same depth from the rear surface of the silicon substrate, and wherein the first layer shields the silicon substrate from the dopant of the second layer; forming a rear passivation layer on the n-doped region and the p-doped region, the rear passivation layer including at least one of silicon nitride (SiNx) and silicon oxide (SiOx); removing portions of the rear passivation layer to partially expose the n-doped region and the p-doped region; and forming a first electrode electrically connected to the n-doped region and a second electrode electrically connected to the p-doped region, wherein the forming of the first or second electrode comprises: forming a metal layer having a first section in contact with one of the n-doped region and the p-doped region, and a second section in contact with the rear passivation layer;
forming a diffusion barrier layer on the metal layer;forming a first conductive layer on the diffusion barrier layer; andforming a second conductive layer on the first conductive layer. |
地址 |
Seoul KR |