发明名称 METHODS OF PROVIDING ELECTRICAL ISOLATION AND SEMICONDUCTOR STRUCTURES INCLUDING SAME
摘要 Methods of isolating gates in a semiconductor structure. In one embodiment, isolation is achieved using a spacer material in combination with fins having substantially vertical sidewalls. In another embodiment, each characteristics of various materials utilized in fabrication of the semiconductor structure are used to increase an effective gate length ("L effective ") and a field gate oxide. In yet another embodiment, a V-shaped trench is formed in the semiconductor structure to increase the L effective and the field gate oxide. Semiconductor structures formed by these methods are also disclosed.
申请公布号 EP3082156(A1) 申请公布日期 2016.10.19
申请号 EP20160166494 申请日期 2009.05.28
申请人 MICRON TECHNOLOGY, INC. 发明人 GILGEN,, BRENT, D.;GRISHAM,, PAUL;LANE,, RICHARD, H.
分类号 H01L21/76;H01L21/8234;H01L21/8242;H01L27/088;H01L27/108;H01L29/06;H01L29/66;H01L29/78 主分类号 H01L21/76
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