INTEGRATED CIRCUIT DESIGN SCALING FOR RECOMMENDING DESIGN POINT

摘要

In one aspect, a method for providing design point recommendations for an integrated circuit (IC) design is disclosed. The method comprises receiving an IC design along with a reference PPA (power, performance, area) metric at a reference design point, and a target PPA metric. The method also comprises estimating trial PPA metrics for the IC design at multiple design points, wherein estimating trial PPA metric at each design point includes accessing a PPA database containing PPA metrics for multiple test components, determining scale factors from the reference design point to the trial design point for test components equivalent to components of the IC design, and applying the scale factors to the reference PPA metric to determine the trial PPA metric for the trial design point. The method further comprises recommending a trial design point based on the estimated trial PPA metric and the received target PPA metric.

主权项

1. A method performed by a computer system for recommending a design point for an integrated circuit design, the method comprising:
receiving an integrated circuit design, the integrated circuit design comprising a plurality of circuit components; receiving a reference PPA (power, performance, area) metric for the integrated circuit design evaluated at a reference design point; receiving a target PPA metric for the integrated circuit design; estimating trial PPA metrics for the integrated circuit design evaluated at a plurality of trial design points within a design space, wherein for each trial design point the estimating comprises:
accessing a PPA database that contains PPA metrics for multiple test components evaluated at multiple design points;determining, by the computer system, scale factors for the circuit components in the integrated circuit design, the scale factors based on: scaling from (a) the reference design point to (b) the trial design point, of equivalent test components to the circuit components; andapplying the scale factors to the reference PPA metric to determine the trial PPA metric at the trial design point; and based on the estimated trial PPA metrics and the target PPA metric, recommending a trial design point for the integrated circuit design, wherein the integrated circuit design is providable for subsequent design and manufacturing of the integrated circuit.