Waveguide probe for nondestructive material characterization

摘要

An open-ended waveguide probe including a finite flange extending outwardly and functioning as an infinite flange. A signal source provides a microwave signal to the waveguide, which in turn transmits microwave electromagnetic energy incident upon an object to be tested. The finite flange at the waveguide's aperture is shaped to reduce scattering of the electromagnetic field reflected from the object and received by the aperture. The probe is adapted for coupling to a receiver for sampling the reflected electromagnetic field received by the aperture and the receiver is adapted for coupling to a processor for determining at least one material characteristic of the object based on sampled electromagnetic field reflected from the object.

主权项

1. An open-ended waveguide apparatus comprising:
a hollow guide structure and a signal source coupled thereto, said guide structure further having an open end defining an aperture through which an electromagnetic signal generated by the signal source is transmitted to an object located remotely from the aperture and through which an electromagnetic field reflected from the object is received by the aperture; and a flange extending outwardly from the guide structure at the aperture, said flange having one or more continuously curved edge margins shaped to reduce undesired electromagnetic scattering from one or more edges of the flange and received by the aperture, wherein the guide structure is adapted for coupling to a receiver for sampling the reflected electromagnetic field received by the aperture, and wherein the receiver is adapted for coupling to a processor for determining at least one material characteristic of the object based on a sampled electromagnetic field reflected from the object.