发明名称 PROCESS FOR EPITAXIALLY GROWING SILICON THIN LAYERS
摘要 <p>Process for compensating for the presence of boundary charges in semiconductor layers which are grown on a monocrystalline insulating substrate including the stop of introducing doping atoms into the region of the boundary charges. The doping atoms can be introduced before any semiconductor has been deposit?? after a thin layer of the semiconductor has been epitaxially grown on the substrate, or after all of the epitaxial layer has been grown.</p>
申请公布号 CA1044577(A) 申请公布日期 1978.12.19
申请号 CA19740208240 申请日期 1974.08.30
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 STEIN, KARL-ULRICH
分类号 H01L29/78;H01L21/00;H01L21/265;H01L21/314;H01L21/86;H01L29/786;(IPC1-7):01J17/02 主分类号 H01L29/78
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