发明名称 |
PROCESS FOR EPITAXIALLY GROWING SILICON THIN LAYERS |
摘要 |
<p>Process for compensating for the presence of boundary charges in semiconductor layers which are grown on a monocrystalline insulating substrate including the stop of introducing doping atoms into the region of the boundary charges. The doping atoms can be introduced before any semiconductor has been deposit?? after a thin layer of the semiconductor has been epitaxially grown on the substrate, or after all of the epitaxial layer has been grown.</p> |
申请公布号 |
CA1044577(A) |
申请公布日期 |
1978.12.19 |
申请号 |
CA19740208240 |
申请日期 |
1974.08.30 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
STEIN, KARL-ULRICH |
分类号 |
H01L29/78;H01L21/00;H01L21/265;H01L21/314;H01L21/86;H01L29/786;(IPC1-7):01J17/02 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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