TEST CIRCUIT FOR MEMORY,申请号JP19770091372-传众专利搜索

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发明名称	TEST CIRCUIT FOR MEMORY
摘要
申请公布号	JPS5427327(A)	申请公布日期	1979.03.01
申请号	JP19770091372	申请日期	1977.08.01
申请人	HITACHI LTD	发明人	UCHIYAMA TAKEO
分类号	G11C29/00;G06F11/22;G11C29/56	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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