发明名称 Opening in a multilayer polymeric dielectric layer without delamination
摘要 An integrated circuit and method with a delamination free opening formed through multiple levels of polymer dielectric. The opening has a vertical sidewall and no interface between adjacent levels of polymer dielectric is exposed on the vertical sidewall.
申请公布号 US9502365(B2) 申请公布日期 2016.11.22
申请号 US201414576784 申请日期 2014.12.19
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 Han Licheng Marshal;Serafin Michael Andrew;Williams Byron;Varela Sandra Rodriguez;Pavone Salvatore
分类号 H01L21/4763;H01L23/00;H01L23/31;H01L23/532;H01L49/02;H01L21/768;H01L21/784;H01L23/522 主分类号 H01L21/4763
代理机构 代理人 Garner Jacqueline J.;Cimino Frank D.
主权项 1. A process of forming an integrated circuit, comprising the steps: coating the integrated circuit with a first layer of a photosensitive polymer dielectric; exposing a first opening in the first layer using a first opening photo mask; developing the first layer to form the first opening with a first layer edge; curing the first layer; coating the integrated circuit with an overlying layer of a photosensitive polymer dielectric; exposing an IC opening in the overlying layer of photosensitive polymer layer using an IC opening photomask; developing the overlying layer of photosensitive polymer to form an IC opening; curing the overlying layer; coating the integrated circuit with a second layer of a photosensitive polymer dielectric; exposing a second opening in the second layer of photosensitive polymer layer using a second opening photomask; developing the second layer of photosensitive polymer to form the second opening; wherein the IC opening and the first opening are concentric; wherein the IC opening is smaller than the first opening; and wherein the overlying layer covers the first layer edge.
地址 Dallas TX US