发明名称 |
Opening in a multilayer polymeric dielectric layer without delamination |
摘要 |
An integrated circuit and method with a delamination free opening formed through multiple levels of polymer dielectric. The opening has a vertical sidewall and no interface between adjacent levels of polymer dielectric is exposed on the vertical sidewall. |
申请公布号 |
US9502365(B2) |
申请公布日期 |
2016.11.22 |
申请号 |
US201414576784 |
申请日期 |
2014.12.19 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Han Licheng Marshal;Serafin Michael Andrew;Williams Byron;Varela Sandra Rodriguez;Pavone Salvatore |
分类号 |
H01L21/4763;H01L23/00;H01L23/31;H01L23/532;H01L49/02;H01L21/768;H01L21/784;H01L23/522 |
主分类号 |
H01L21/4763 |
代理机构 |
|
代理人 |
Garner Jacqueline J.;Cimino Frank D. |
主权项 |
1. A process of forming an integrated circuit, comprising the steps:
coating the integrated circuit with a first layer of a photosensitive polymer dielectric; exposing a first opening in the first layer using a first opening photo mask; developing the first layer to form the first opening with a first layer edge; curing the first layer; coating the integrated circuit with an overlying layer of a photosensitive polymer dielectric; exposing an IC opening in the overlying layer of photosensitive polymer layer using an IC opening photomask; developing the overlying layer of photosensitive polymer to form an IC opening; curing the overlying layer; coating the integrated circuit with a second layer of a photosensitive polymer dielectric; exposing a second opening in the second layer of photosensitive polymer layer using a second opening photomask; developing the second layer of photosensitive polymer to form the second opening; wherein the IC opening and the first opening are concentric; wherein the IC opening is smaller than the first opening; and wherein the overlying layer covers the first layer edge. |
地址 |
Dallas TX US |