发明名称 |
Test device, semiconductor device and testing method thereof |
摘要 |
A test device for testing a semiconductor device including a TSV may comprise a ring oscillator including a plurality of inverters, a switch selectively connecting an output node of an inverter of the plurality of inverters and the TSV, and a controller controlling the switch. |
申请公布号 |
US9459309(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201313945819 |
申请日期 |
2013.07.18 |
申请人 |
SK HYNIX INC.;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
Pak Jun-So;Lee Jun-Ho;Kim Joung-Ho |
分类号 |
G01R31/26;G01R31/319;G01R31/28 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
1. A test device for testing a semiconductor device including a through silicon via (TSV), the test device comprising:
a ring oscillator including a plurality of inverters; a counter counting a clock signal output from the ring oscillator; a switch selectively connecting an output node of an inverter of the plurality of inverters with the TSV; and a controller controlling the switch to disconnect the node and the TSV for a first time period and to connect the node and the TSV for a second time period, wherein the controller tests the TSV by comparing a first counter value of the counter for the first time period to a second counter value of the counter for the second time period, and the controller determines that the TSV has passed a test when a difference between the first counter value and the second counter value is greater than a threshold value. |
地址 |
Icheon KR |