发明名称 PREPARATION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To lessen a change of conductance by a method wherein when an Al gate self-matching MOS transistor is prepared, B<+> ions are injected into the substrate about the gate electrode and a region with high layer resistance is formed by applying a laser beam to that part. CONSTITUTION:The N-type Si substrate 21 is coated with SiO2 film, the gate SiO2 film 23 is left between the source and drain regions 24, 25 to be formed, the protective SiO2 film 22 is left on other part, and B impurity is diffused into the substrate to form the P-type regions 24, 25. Next Al film is applied to the entire surface of the substrate, and is patterned to form the source electrode 26, drain electrode 27 and gate electrode 28. B<+> ions are injected into the substrate about the electrode 28 by using those electrodes as masks to form a shallow ion-injected layer 29. After this, a Q-switch ruby laser beam 30 is applied to the layer 29 to anneal it, and a high resistance of 3kOMEGA/cm<2> is provided to the layer. In this way, a change of conductance can be controlled within a range of + or -2% even with a large current operation for a long time.
申请公布号 JPS55165679(A) 申请公布日期 1980.12.24
申请号 JP19790073529 申请日期 1979.06.13
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 OOMURA KAZUMICHI
分类号 H01L21/265;H01L21/331;H01L29/73;H01L29/78 主分类号 H01L21/265
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