| 发明名称 | Method and device for generating a focused strong-current charged-particle beam | ||
| 摘要 | The invention relates to a method for generating a focused charged-particle beam, comprising at least the steps of: a) generating a charged-particle beam (10); b) emitting a laser pulse (40); c) generating a focusing magnetic field structure in a target (50) by means of an interaction between the laser pulse and the target; and d) making the charged-particle beam penetrate the focusing magnetic field structure at least partially. | ||
| 申请公布号 | US9514908(B2) | 申请公布日期 | 2016.12.06 |
| 申请号 | US201314437739 | 申请日期 | 2013.10.22 |
| 申请人 | ECOLE POLYTECHNIQUE;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S.);INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE (INRS) | 发明人 | Fuchs Julien;Albertazzi Bruno;Pepin Henri;D'Humieres Emmanuel |
| 分类号 | H01J37/04;H01J3/22;G21K1/093 | 主分类号 | H01J37/04 |
| 代理机构 | Oliff PLC | 代理人 | Oliff PLC |
| 主权项 | 1. A method for generating a focused beam of charged particles, the method comprising: a) generating a beam of charged particles; b) emitting a laser pulse; c) generating a focusing magnetic field structure in a target by means of an interaction of said laser pulse with said target; and d) causing at least partial penetration of the beam of charged particles into said focusing magnetic field structure, wherein in step b), a laser contrast of the laser pulse is increased. | ||
| 地址 | Palaiseau FR | ||