| 摘要 |
PURPOSE:To compensate degradation of sensitivity due to the radiation damage of a semiconductor sensing part, by simultaneously, measuring the radiation by using a plurality of the semiconductor detecting parts having different thicknesses, and comparing the output signals from said semiconductor detecting parts. CONSTITUTION:A detecting element 1 is thinner than a detecting element 2 in thickness, and absorbes only the samll quantity of the radiation. Therefore the element 1 is hard to be damaged, and the curve of the signal A is flat in comparison with that of the signal B. A sensitivity ratio A/B is obtained from a dividing circuit 4. Then a compensating constant C is outputted from a compensating constant generator 5. The output of the detecting element 2 is compensated by said compensating constant C, and the irradiated dosage rate is displayed by a dosage rate display 7. In this constitution, the sensitivity compensation before the measurement in order to check the radiation damage of the semiconductor detecting element can be omitted. |
