| 摘要 |
PURPOSE:To improve marking identification work efficiency by eliminating irregular reflection through coating of marking ink having good light reflecting characteristic on the rough surface of defective element. CONSTITUTION:Adequacy of transistor is judged by applying a voltage thereto provided on the pellet wafer using a characteristic measuring probe. When transistor is judged good, it is remained as it is but if it is defective, a marking 14 is given on the surface of protecting film 19 on defective transistor by giving a spot or painted area of the dissolved marking ink 20 reserved using the marking pen which inject said marking ink from the opening of the lower part. |
