发明名称 Glass passivated high power semiconductor devices
摘要 A process for producing a glass passivated semiconductor device, such as a thyristor, comprises forming a first groove 56 in a large area body of semiconductor material, forming regions 62,64,66, of alternating type conductivity within the area enclosed by the groove and then forming a second shallower groove within the area enclosed by the first groove, the second groove then being coated with glass 84 to passivate the surfaces exposed by the second groove. Electrodes 90,96 are then affixed to preselected regions to form a semiconductor device. A plurality of such devices may be made in a single semiconductor body and separated by cutting through the body outside the first groove. <IMAGE>
申请公布号 GB2123207(A) 申请公布日期 1984.01.25
申请号 GB19820018849 申请日期 1982.06.30
申请人 * WESTINGHOUSE ELECTRIC CORPORATION 发明人 JOHN ANTHONY * OSTOP;ROBERT WILLIAM * MARKS
分类号 H01L21/56;H01L23/29;H01L23/31;H01L29/06;(IPC1-7):H01L21/46 主分类号 H01L21/56
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