发明名称 SCANNING ELECTRON MICROSCOPE
摘要 PURPOSE:To magnify the field of observation in making the largest scanning point separate from an axial center, by forming a crossover intermediate image in space between a second scanning coil and an objective lens, while making the image incident into the objective lens in a state of parallelism with an electron beam as an axis. CONSTITUTION:Selecting a minimal magnification with a magnification setter 15, the magnification of a condenser lens 2 is set to be small while that of an objective lens is set to be large and furthermore, a channel selector 12 is turned to a contact (b) side and a stop 6 is removed from an electron beam channel. Then, a crossover intermediate image is formed in a point A' between a second scanning coil 4 and the objective lens 5, while an electron beam is deflected toward outside an axis with a first scanning coil 3, then turned back in parallel with the axis with the second scanning coil 4 and a crossover image is formed at a point C' on a sample 7. Accordingly, the nearer the point A' to the objective lens 5 side the farther the maximum scanning point from the axial center, so that the field of observation can be sharply magnified.
申请公布号 JPS5971245(A) 申请公布日期 1984.04.21
申请号 JP19820181265 申请日期 1982.10.18
申请人 NIPPON DENSHI KK 发明人 OBARA KENJI
分类号 H01J37/147;H01J37/28 主分类号 H01J37/147
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