发明名称 MANUFACTURE OF SILICON WAFER
摘要 PURPOSE:To obtain the wafer of high purity and high quality by diffusing P during the manufacturing process of the Si single crystalline wafer and gettering an internal impurity into a P diffusing layer. CONSTITUTION:A wafer piece cut out of ingot is lapped, and the P diffusing layers 11 in approximately 20mum depth are formed on both surfaces through treatment for 0.2-5hr at 1,100 deg.C by using POCl3. The layers 11 are removed through etching, and a main surface is mirror-ground, washed and packed. According to the constitution, the wafer of high purity and high quality is obtained.
申请公布号 JPS5999727(A) 申请公布日期 1984.06.08
申请号 JP19820209649 申请日期 1982.11.30
申请人 TOSHIBA KK 发明人 OOTSUKA HIDEO
分类号 H01L21/322;(IPC1-7):01L21/322 主分类号 H01L21/322
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