发明名称 |
Particle measuring apparatus |
摘要 |
A particle measuring apparatus comprising a flow cell configured to flow a specimen, a first light source configured to emit light having a first wavelength, a second light source configured to emit light having a second wavelength different from the first wavelength, an irradiation optical system configured to irradiate the flow cell with light emitted from the first light source and the second light source, a first light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the first light source, and a second light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the second light source. |
申请公布号 |
US9513206(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201414227618 |
申请日期 |
2014.03.27 |
申请人 |
SYSMEX CORPORATION |
发明人 |
Yamada Kazuhiro;Yamamoto Takeshi |
分类号 |
G01N15/14;G01N35/02;G01N15/10;G01N15/00;G01N35/00;G01N35/04 |
主分类号 |
G01N15/14 |
代理机构 |
Brinks Gilson & Lione |
代理人 |
Brinks Gilson & Lione |
主权项 |
1. A particle measuring apparatus comprising:
a flow cell configured to flow a specimen; a first light source configured to emit light having a first wavelength; a second light source configured to emit light having a second wavelength different from the first wavelength; an irradiation optical system configured to irradiate the flow cell with light emitted from the first light source and the second light source, the irradiation optical system including:
a dichroic mirror configured to transmit the light emitted from the first light source and reflect the light emitted from the second light source, anda light collecting lens configured to collect the light emitted from the first and second light sources and passed through the dichroic mirror at the flow cell, wherein the second light source and the dichroic mirror are turnable about rotation axis that are orthogonal to one another; a first light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the first light source; and a second light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the second light source. |
地址 |
Kobe JP |