| 摘要 |
PURPOSE:To enable to easily conduct tests for plural circuit blocks in one piece of integrated circuit having a testing function as well as to improve the trouble detecting rate by the integrated circuit by a method wherein a group of circuits in the integrated circuit is divided into the plural circuit blocks. CONSTITUTION:Circuit blocks 2A and 2B and an input and output switching gate 3 are formed in an LSI. For example, in case a test for the circuit block 2A is conducted, the TSTA is set at TSTA=H (high level) and the TSTB is set at TSTB=L, and at the same time, a test vector is supplied to input terminals I1 and I2 respectively. When the TSTA is in a state of TSTA=H and the TSTB is in a state of TSTB=L, the input terminal I1 and a terminal AI1 are mutually connected and an output terminal AO1 and an output terminal O1 are mutually connected. Moreover, the input terminal I2 is connected to a terminal AY and a terminal AX is connected to an output terminal O2. A test vector is supplied from the input terminals I1 and I2 respectively and output, which are outputted from the output terminals O1 and O2, are respectively collated with the expected values for the output, thereby enabling to easily conduct independently the test for the circuit block 2A. |
