AUTOMATED DYNAMIC MANUFACTURING SYSTEMS AND RELATED METHODS

摘要

Automated dynamic manufacturing systems may provide for alignment of multiple components with respect to one another, such as an apparatus, a robot, and a supply of parts. The alignment may initially be performed roughly, using a global metrology device configured to track the apparatus, robot, and supply of parts, each of which may be movable with respect to the others, such as by being positioned on a respective automated guided vehicle. Alignment may then be performed to closer tolerances using a local metrology device coupled to the robot and configured to accurately position an end effector, such that the end effector may perform a manufacturing task on the apparatus, such as a pick-and-place process involving transporting an individual part from the supply of parts, transferring it to the apparatus, and coupling it thereto. Such systems and methods may be used to perform manufacturing processes on large apparatus, such as aircraft.

主权项

1. A system for performing a task on an apparatus, the system comprising:
the apparatus; a supply of parts comprising a plurality of parts located apart from the apparatus; a robot having an end effector, wherein the end effector is configured to perform the task on the apparatus using one or more of the plurality of parts, the robot comprising a local metrology device configured to position the end effector with respect to the apparatus using a local vision system, such that the end effector is aligned with the apparatus sufficiently to perform the task; and a global metrology device configured to track positions of the apparatus, the robot, and the supply of parts using a global vision system, wherein the global metrology device is configured to communicate data to the robot about the positions of the apparatus and the supply of parts, and wherein the global metrology device is configured to receive feedback regarding actual positions of the robot, the apparatus, and the supply of parts, and wherein the local metrology device is configured to supplement the global metrology device in positioning the end effector.