| 摘要 |
PURPOSE:To facilitate a package test or the like by providing a logical circuit, a shift register and input and output terminals to control the supply and lead-out of signals inputted into or outputted out of memory elements by respective control means according to first and second test directions. CONSTITUTION:A logical circuit 2 of an integrated logical circuit device (LSI)1 and a shift register 3 of an FF are provided. A bidirectional circuit 4 of a control means is provided between the logical circuit 2 and the register 3 and input terminals IN1-INn of the LSI1 while a bidirectional circuit 5 thereof is provided between those and output terminals OUT1-OUTn. Then, first and second test direction terminals T2 and T1 control the supply and fetch of signals between input and output terminals to which the input terminals IN1-INn of the LSI1, the output terminals OUT1-OUTn thereof, the register 3 and the logical circuit 5 correspond respectively with each other. This facilitates the testing of the inside of the LSI1 and a package.
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