发明名称 Semiconductor package and fabrication method thereof
摘要 A fabrication method of a semiconductor package is disclosed, which includes the steps of: providing a semiconductor structure having a carrier, a circuit portion formed on the carrier and a plurality of semiconductor elements disposed on the circuit portion; disposing a lamination member on the semiconductor elements; forming an insulating layer on the circuit portion for encapsulating the semiconductor elements; and removing the carrier. The lamination member increases the strength between adjacent semiconductor elements so as to overcome the conventional cracking problem caused by a CTE mismatch between the semiconductor elements and the insulating layer when the carrier is removed.
申请公布号 US9520304(B2) 申请公布日期 2016.12.13
申请号 US201314074148 申请日期 2013.11.07
申请人 Siliconware Precision Industries Co., Ltd. 发明人 Chang Hong-Da;Lai Yi-Che;Chiu Chi-Hsin;Chiu Shih-Kuang
分类号 H01L23/28;H01L21/48;H01L23/00;H01L23/538;H01L23/31;H01L21/56 主分类号 H01L23/28
代理机构 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. 代理人 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. ;Corless Peter F.;Jensen Steven M.
主权项 1. A semiconductor package, comprising: a circuit portion having opposite first and second sides; a plurality of semiconductor chips disposed on the first side of the circuit portion; a lamination member disposed on the semiconductor chips so as to increase a strength between the semiconductor chips, wherein the lamination member is a dummy die; and an insulating layer formed on the first side of the circuit portion for encapsulating the semiconductor chips.
地址 Taichung TW