发明名称 Photo emitter X-ray source array (PeXSA)
摘要 A photo-emitter x-ray source is provided that includes a photocathode electron source, a laser light source, where the laser light source illuminates the photocathode electron source to emit electrons, and an X-ray target, where the emitted electrons are focused on the X-ray target, where the X-ray target emits X-rays. The photocathode electron source can include alkali halides (such as CsBr and CsI), semiconductors (such as GaAs, InP), and theses materials modified with rare Earth element (such as Eu) doping, electron beam bombardment, and X-ray irradiation, and has a form factor that includes planar, patterned, or optically patterned. The X-ray target includes a material such as tungsten, copper, rhodium or molybdenum. The laser light source is pulsed or configured by light modulators including acousto-optics, mode-locking, micro-mirror array, and liquid crystals, the photocathode electron source includes a nano-aperture or nano-particle arrays, where the nano-aperture is a C-aperture or a circular aperture.
申请公布号 US9520260(B2) 申请公布日期 2016.12.13
申请号 US201314026697 申请日期 2013.09.13
申请人 The Board of Trustees of the Leland Stanford Junior University 发明人 Hesselink Lambertus;Pease R. Fabian W.;Pianetta Piero;Maldonado Juan R.;Cheng Yao-Te;Ryan Jason
分类号 H01J35/06;H01J35/14;H01J35/02 主分类号 H01J35/06
代理机构 Lucent Patent Firm 代理人 Lucent Patent Firm
主权项 1. A photo-emitter x-ray source, comprising: a. a photocathode electron source; b. a laser light source; c. a beam forming device comprising a spatial light modulator; d. electron optics; and e. an X-ray target, wherein said laser light source outputs a beam directed to said spatial light modulator, wherein said spatial light modulator forms said beam into an optical spatially patterned beam, wherein said optical spatially patterned beam illuminates said photocathode electron source, wherein said photocathode electron source emits electrons having an electron pattern according to said spatial light modulator, wherein said electron optics comprises an electric field, a magnetic field, or said electric field and said magnetic field disposed to image said electron pattern onto said X-ray target, wherein said X-ray target emits a pattern of X-rays, wherein said pattern of X-rays comprise a patterned partially-coherent X-ray beam.
地址 Palo Alto CA US