发明名称 |
FORMING METHOD FOR AMORPHOUS SEMICONDUCTOR FILM |
摘要 |
PURPOSE:To reduce the production of powder and to enable the accumulation of a uniform film even in a large area by executing in gas pressure which is specific for ion average free step in a vessel in the width of a sheath when radical-forming a raw gas to accumulate it on a substrate. CONSTITUTION:Gas containing hydrogen as exciting gas is supplied from an exciting gas supply port 13 to an ion source. Magnets 15 are disposed on the back and side surfaces of a plasma source 14 to form a cusp magnetic field 15a. An AC voltage is applied between a filament 16 and anode (wall) 17 to discharge, thereby generating a plasma. The plasma passes through a porous grid 18 to a reaction chamber 20 in which raw gas is supplied in advance from a raw gas inlet 19 to move by a dispersed magnetic field by an external magnetic field 21 to contact with raw gas (SiH4) to form a radical. Since a negative bias is applied to a substrate 22 in the chamber, cation in the plasma is accelerated to the substrate 22. A sheath of width SiS formed between the substrate 22 and the plasma is accumulated under the gas pressure of SiS<lambda with respect to the average free stroke lambda of the ion. |
申请公布号 |
JPS61283112(A) |
申请公布日期 |
1986.12.13 |
申请号 |
JP19850125305 |
申请日期 |
1985.06.10 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
TANAKA EIICHIRO;TAKIMOTO AKIO;AKIYAMA KOJI;KURAMOTO AKIMASA |
分类号 |
H01L31/04;G03G5/08;H01L21/205 |
主分类号 |
H01L31/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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