发明名称 Spectroscopic measurement system.
摘要 <p>A spectroscopic measurement system comprises at least two kinds of diffraction gratings (1,2) whose grating surfaces are in line, an exchange device (3,4) for exchanging the positions of the two kinds of diffraction gratings (1,2) in connection with incident light to be measured while the two kinds of diffraction gratings (1,2) are placed in a predetermined rotation angle, at least two kinds of detectors (5,6) having characteristics corresponding to those of the two kinds of diffraction gratings (1,2), respectively, a light path switch (7) for switching a path of diffraction light toward either of the two kinds of detectors (5,6), and a switch circuit (9) for switching the detection output of the two kinds of detectors (5,6) in synchronization with the exchange operation of the two kinds of diffraction gratings (1,2).</p>
申请公布号 EP0271602(A1) 申请公布日期 1988.06.22
申请号 EP19860117744 申请日期 1986.12.19
申请人 SHIMADZU CORPORATION 发明人 SHIMOMURA, TEIICHI
分类号 G01J3/06;G01J3/18;(IPC1-7):G01J3/18 主分类号 G01J3/06
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