发明名称 Apparatus for inspecting the surface of a material
摘要 An apparatus for inspecting the surface of a material having a first inspection section for inspecting the wide surface condition of a material with an analysis, a second inspection section for inspecting specific position's conditions of the surface of the material with finer analysis than that of the first inspection section, and a controller for controlling an inspecting position of the second inspection section to inspect an unusual position after the first inspection section finds the unusual position.
申请公布号 US4764969(A) 申请公布日期 1988.08.16
申请号 US19870007092 申请日期 1987.01.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OHTOMBE, KO;NISHIKAWA, MASAMITU
分类号 G01B11/30;G01N21/88;G01N21/95;G01N21/956;G03F1/08;G06T7/00;H01L21/027;H01L21/66;(IPC1-7):G06K9/00 主分类号 G01B11/30
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