发明名称 |
Apparatus for inspecting the surface of a material |
摘要 |
An apparatus for inspecting the surface of a material having a first inspection section for inspecting the wide surface condition of a material with an analysis, a second inspection section for inspecting specific position's conditions of the surface of the material with finer analysis than that of the first inspection section, and a controller for controlling an inspecting position of the second inspection section to inspect an unusual position after the first inspection section finds the unusual position.
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申请公布号 |
US4764969(A) |
申请公布日期 |
1988.08.16 |
申请号 |
US19870007092 |
申请日期 |
1987.01.27 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
OHTOMBE, KO;NISHIKAWA, MASAMITU |
分类号 |
G01B11/30;G01N21/88;G01N21/95;G01N21/956;G03F1/08;G06T7/00;H01L21/027;H01L21/66;(IPC1-7):G06K9/00 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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