发明名称 Field-effect transistor
摘要 A field-effect transistor having a high breakdown voltage has a p-semiconductor substrate (5), a plurality of pairs of source regions (S) and drain regions (D), which have respectively n<-> imperfection diffusion regions (3) formed in the substrate (5), gate electrodes (9), which are formed by an insulating film (2) lying on a region between each of the source regions (S) and each of the drain regions (D), n<+> imperfection regions (4), which are formed displaced by a constant amount in the n<-> imperfection layers (3), a source connection (7a) connecting a plurality of source regions (S), and a drain connection (7b), which connects a plurality of drain regions (D) in the plurality of pairs in such a way, that a deviation error caused by displacement is compensated. <IMAGE>
申请公布号 DE3818533(A1) 申请公布日期 1988.12.22
申请号 DE19883818533 申请日期 1988.05.31
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 MIYAZAKI, YUKIO, ITAMI, HYOGO, JP
分类号 H01L29/06;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/06
代理机构 代理人
主权项
地址