发明名称 Method of forming completely metallized via holes in semiconductors
摘要 A method is disclosed for forming completely metallized via holes in semiconductor wafers. Metal pads are formed on one face of a semiconductor wafer together with a conductive interconnecting network. An insulating layer is then deposited to cover this face of the wafer. Holes are etched in the opposite face of the wafer up to and exposing a portion of the metal pads. The via holes are then completely filled with metal by means of electroplating, using the metal pads as a cathode.
申请公布号 US4808273(A) 申请公布日期 1989.02.28
申请号 US19880192343 申请日期 1988.05.10
申请人 AVANTEK, INC. 发明人 HUA, CHANG-HWANG;DAY, DING-YUAN S.;CHAN, SIMON S.
分类号 H01L21/74;H01L21/768;(IPC1-7):C25D5/02 主分类号 H01L21/74
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