发明名称 FORMING METHOD OF PASSIVATION FILM
摘要 The forming method of a passivation film (I) on a circuit and/or circuit elements (II) formed on the surface of a semiconductor chip involves patterning (I) with a resist film, which is part of (I) after being subjected to post-baking. The upper layer of (I) is made of light-sensitive polyimide, silicone resin, epoxy resin or a silicone ladder polymer. The semiconductor, upon which (I) is coated, is mounted on a lead frame, wire bonded and then entirely reinforced inclusive of all windows opened in (I).
申请公布号 KR900001656(B1) 申请公布日期 1990.03.17
申请号 KR19860004502 申请日期 1986.06.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAMOTO ESAMU;FUKUSIMA JIRO
分类号 H01L21/31;H01L21/312;H01L21/56;(IPC1-7):H01L21/31 主分类号 H01L21/31
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