发明名称 Method and apparatus for controlling simultaneous etching of front and back sides of wafers.
摘要 An enclosed chamber is provided to confine wafers to be processed with an etchent gas, and requiring moisture at the surface of the wafer in order to initiate the etching. Gases flowed over the face of the wafer and may be flowed across the backside of the wafer to controllably produce or restrict the etching, according to the nature of the gas supplied and flowed across the wafer.
申请公布号 EP0360678(A1) 申请公布日期 1990.03.28
申请号 EP19890402551 申请日期 1989.09.18
申请人 FSI INTERNATIONAL, INC. 发明人 SYVERSON,DANIEL J.
分类号 H01L21/302;H01L21/00;H01L21/3065;H01L21/311 主分类号 H01L21/302
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