| 摘要 |
<p>A probe for providing electrical contact to electrical circuits during the testing thereof. There is a tubular housing (40) having an open end and a generally closed end with a main portion extending from the generally closed end towards the open end and a retaining and sliding bearing portion adjacent the open end having a diameter smaller than the main portion. A probe plunger (12) is disposed in the tubular housing and has a cylindrical inner portion (14) which is a slide fit and disposed within the main portion of the tubular housing and a cylindrical outer portion (18) of a diameter smaller than the inner portion and forming a shoulder (20) with the inner portion at a point of meeting. The outer portion of the plunger passes through the retaining and sliding bearing portion and has an outside diameter which is a slide fit to the inside diameter of the retaining and sliding bearing portion. A longitudinally compressible bias spring (26) is disposed between the generally closed end of the tubular housing and the inner portion of the probe plunger under a pre-loading for biasing the probe plunger towards an extended position.</p> |
