发明名称 X-ray analysis apparatus comprising an adjustable slit diaphragm.
摘要 <p>An X-ray analysis apparatus comprises an adjustable entrance slit (11) which consists of two laminations (13, 15) which are rotatable about axes extending parallel to a theta -axis (6). By choosing the radius of the laminations and their position in the X-ray beam, a substantially more accurate adjustment can be achieved notably for small theta -values. Moreover, asymmetry in the beam path can be simply compensated for and improved shielding against scattered radiation is achieved. &lt;IMAGE&gt;</p>
申请公布号 EP0432844(A1) 申请公布日期 1991.06.19
申请号 EP19900203223 申请日期 1990.12.07
申请人 N.V. PHILIPS' GLOEILAMPENFABRIEKEN 发明人 DE LANGE, ROELOF
分类号 G01N23/20;G01N23/207;G21K1/04;G21K1/06;H05G1/30 主分类号 G01N23/20
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