发明名称 Temperature control system for semiconductor wafer or substrate.
摘要 A temperature control system may be used in conjunction with the sputtering. CVD, etching, and like processes for a substrate (1) on which the semiconductor devices are implemented. This system responds quickly to any change in the temperature of the substrate (1) being processed, by heating or cooling the substrate (1) to the appropriate temperature and maintaining it at its constant temperature. <IMAGE>
申请公布号 EP0451740(A2) 申请公布日期 1991.10.16
申请号 EP19910105469 申请日期 1991.04.06
申请人 ANELVA CORPORATION 发明人 NAKAGAWA, TOSHIYUKI, C/O ANELVA CORPORATION;TAKAHASHI, NOBUYUKI, C/O ANELVA CORPORATION;AKIMOTO, TAKASHI
分类号 H01L21/00;H01L21/683 主分类号 H01L21/00
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