发明名称 APPARATUS FOR MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To remove components which are obstacles against observation and improve operatability by a method wherein a microscope is provided above a bonding stage so as to be moved in X- and Y-directions freely. CONSTITUTION:A microscope 1 is provided above a bonding stage 8 so as to be move in X- and Y-directions freely. In order to perform observation on the bonding stage 8, the microscope 1 itself is moved in the X- and Y-directions with X- and Y-direction guide rails 5a and 5b and obstacles are moved to facilitate the observation. Further, at the time of replacement of bonding head 9 or the bonding stage 8 or assembly ajustment, the microscope 1 is moved in the X-direction and the operation proceeds with no obstacle.
申请公布号 JPH03263335(A) 申请公布日期 1991.11.22
申请号 JP19900063038 申请日期 1990.03.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 ISHIZUKA MITSUHIRO;HAYASHI KAZUYUKI
分类号 H05K13/08;H01L21/60 主分类号 H05K13/08
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