发明名称 Abnormal temperature detector for electronic apparatus
摘要 An abnormal temperature detector for an electronic apparatus includes a plurality of temperature detectors, an abnormality detector, and a power supply controller. The plurality of temperature detectors are arranged at least at one detection point of a rack, of an electronic apparatus, in which a plurality of wiring boards having IC elements mounted thereon are housed, and respectively output detection outputs when a temperature at the detection point becomes a preset temperature or more. The abnormality detector detects that detection outputs are output from all the temperature detectors at the detection point. The power supply controller interrupts a power supply of the apparatus in response to an abnormality detection output from the abnormality detector.
申请公布号 US5079542(A) 申请公布日期 1992.01.07
申请号 US19910665576 申请日期 1991.03.06
申请人 NEC CORPORATION 发明人 UMEZAWA, KAZUHIKO
分类号 G01K1/14;G01K7/00;G05D23/19;G08B17/06;G08B21/18;H02H3/05;H02H5/04;H05K7/20 主分类号 G01K1/14
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