| 摘要 |
The invention relates to a device that can be used to examine, clearly and with the aid of a microscope, the internal connections of the wafers of the housings of light-emitting diodes (LEDs), preventing the dispersion of the light generated in the transparent dome of the diode housing, without having to submerge same in alcohol or any other flammable or dangerous substance or to connect the LEDs to electrical systems. |
