发明名称 |
HIGH RESOLUTION PLASMA MASS SPECTROMETER |
摘要 |
High Resolution Plasma Mass Spectrometer There is disclosed a double-focusing mass spectrometer in which ions are generated from a sample in a microwave-induced or inductively-coupled plasma (3). Ions are sampled from the plasma (3) through an aperture in a sampling cone (19) and pass through a skimmer cone (28) and several electrostatic lenses (30, 33) to the entrance slit of the mass analyzer. The sampling cone (19) and skimmer cone (28) are maintained by a power supply (40) at a potential approximately equal to the accelerating potential required by the mass analyzer. It is found that the plasma potential may be maintained at such a value that a substantial proportion of the ions generated in the plasma (3) have energies lying within the energy passband of the mass analyzer so that a high sensitivity, high resolution a spectrometer capable suitable for the elemental analysis of solid or liquid samples is provided. Such a spectrometer is capable of resolving many of the spectral interferences which restrict the usefulness of conventional quadrupole based plasma mass spectrometers. ¢Fig. 2! |
申请公布号 |
CA1312680(C) |
申请公布日期 |
1993.01.12 |
申请号 |
CA19890601528 |
申请日期 |
1989.06.02 |
申请人 |
VG INSTRUMENTS GROUP LIMITED |
发明人 |
BRADSHAW, NEIL;SANDERSON, NEIL E. |
分类号 |
H01J49/04;H01J49/10;H01J49/32 |
主分类号 |
H01J49/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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